The Influence of Nanoscale Roughness on the Electrostatic Double Layer: the Shift of the Isoelectric Point of Cluster-Assembled Nanostructured Zirconia Films
Abstract:We investigated the influence of the nanoscale surface morphology on the electrostatic double layer at corrugated surfaces in aqueous electrolytes. To this purpose, we have produced cluster-assembled nanostructured zirconium dioxide (ns-ZrOx, x ≈ 2) films with controlled morphological properties by supersonic cluster beam deposition (SCBD), and measured the double layer interaction using atomic force microscopy with colloidal probes. SCBD allowed tuning the characteristic widths of the corrugated interface (th… Show more
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