2014
DOI: 10.1088/0067-0049/212/2/25
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The Imaging Properties of the Gas Pixel Detector as a Focal Plane Polarimeter

Abstract: X-rays are particularly suited to probing the physics of extreme objects. However, despite the enormous improvements of X-ray astronomy in imaging, spectroscopy, and timing, polarimetry remains largely unexplored. We propose the photoelectric polarimeter Gas Pixel Detector (GPD) as a candidate instrument to fill the gap created by more than 30 yr without measurements. The GPD, in the focus of a telescope, will increase the sensitivity of orders of magnitude. Moreover, since it can measure the energy, the posit… Show more

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Cited by 33 publications
(26 citation statements)
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“…The imaging capabilities of the detector were measured either in laboratory with a narrow pencil beam 17 and at the PANTER X-ray test facility. 18 We disentangled the various components concurring to the overall angular resolution confirming the expectation 19 that the main contribution is provided by the performances of the optics. The second contribution for importance is given by the inclined penetration of the photons in the 1-cm thick drift region, due to the narrow incidence optics, while the intrinsic position resolution of the detector provides a negligible contribution.…”
Section: The Detector Capabilitysupporting
confidence: 72%
“…The imaging capabilities of the detector were measured either in laboratory with a narrow pencil beam 17 and at the PANTER X-ray test facility. 18 We disentangled the various components concurring to the overall angular resolution confirming the expectation 19 that the main contribution is provided by the performances of the optics. The second contribution for importance is given by the inclined penetration of the photons in the 1-cm thick drift region, due to the narrow incidence optics, while the intrinsic position resolution of the detector provides a negligible contribution.…”
Section: The Detector Capabilitysupporting
confidence: 72%
“…While this is not expected to affect the PSF characterization of grazing-incidence mirrors (which reflectivity is fairly independent of the polarization state), it can be useful to perform X-ray polarimetry experiments. [12] Silicon cannot efficiently diffract 1.49 keV X-rays. For the setup corresponding to this energy, it should be replaced by ADP (101) -Ammonium Dihydrogen Phosphate, NH 4 H 2 PO 4 (5.32 Å d-spacing, corresponding to a 51.46 deg Bragg angle).…”
Section: Optical Component Descriptionmentioning
confidence: 99%
“…The use of a polarized beam does not affect the PSF and the effective area of the XOU, because in grazing incidence the reflectivity is almost exactly same for both polarization states, but it provides the additional opportunity to test X-ray polarimetric systems. 16…”
Section: Symmetric Crystalsmentioning
confidence: 99%