“…[ 18 ] PES studies have been mostly done on the single crystal surfaces or at the interface using the sequential deposition of overlayer film. [ 5,6,19,20 ] There are also few studies where a special type of PES, namely, hard X‐ray photoelectron spectroscopy (HAXPES), and sputter depth profiling PES (SDP‐PES), were used to study bulk of the PSCs. HAXPES uses synchrotron radiation, i.e., a tunable X‐ray source, where the photon energy can be adapted to selectively increase or decrease the surface sensitivity of the measurements.…”