The Electrical Double Layer on Gold Probed by Electrokinetic and Surface Force Measurements

Giesbers, Marcel; Kleijn, J. Mieke; Stuart, Martien A. Cohen

doi:10.1006/jcis.2001.8144

Cited by 137 publications

(136 citation statements)

References 36 publications

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“…With the AFM DLVO forces were measured between several materials which are of special interest in colloidal science, e.g. glass, silica, and silicon nitride [15,16,187,[427][428][429][430][431][432][433][434]; gold [327,429,435,436]; copper and nickel [437]; zinc and lead sulphide [171,172,438]; titanium oxide [169,339,340]; zirconia [165,166,410]; iron oxide [439]; tungsten [175]; cobalt [175]; and alumina [16,[439][440][441][442]. Different polymers [177,189,[443][444][445][446][447], Langmuir-Blodgett and other thin organic layers [126,329,411,448,449] have been analyzed.…”

Section: Electrostatic Double-layer Force and Dlvo Theorymentioning

confidence: 99%

Force measurements with the atomic force microscope: Technique, interpretation and applications

Butt

Cappella

Kappl

2005

Surface Science Reports

3,198

2,949

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Section: Electrostatic Double-layer Force and Dlvo Theorymentioning

confidence: 99%

Force measurements with the atomic force microscope: Technique, interpretation and applications

Butt

Cappella

Kappl

2005

Surface Science Reports

3,198

2,949

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“…20,21 Some studies even remark the absence dispersion forces altogether. [22][23][24] No satisfactory explanation of these discrepancies has been put forward so far. Given the widespread use of silica substrates in contact with water, a clarification of this discrepancy is imperative.…”

Section: Introductionmentioning

confidence: 99%

Dispersion forces acting between silica particles across water: influence of nanoscale roughness

et al. 2016

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“…The complex conductivity K * of the suspension can be expressed as (55) where δK * (ω) is usually called conductivity increment of the suspension. Similarly, the complex dielectric constant of the suspension can be written in terms of a relative permittivity increment or, briefly, dielectric increment δε * r (ω):…”

Section: Operational Definitions; Recommended Symbols and Terminologymentioning

confidence: 99%

Measurement and Interpretation of Electrokinetic Phenomena (IUPAC Technical Report)

2006

Chemistry International -- Newsmagazine for IUPAC

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Republication or reproduction of this report or its storage and/or dissemination by electronic means is permitted without the Measurement and interpretation of electrokinetic phenomena (IUPAC Technical Report)Abstract: In this report, the status quo and recent progress in electrokinetics are reviewed. Practical rules are recommended for performing electrokinetic measurements and interpreting their results in terms of well-defined quantities, the most familiar being the ζ-potential or electrokinetic potential. This potential is a property of charged interfaces, and it should be independent of the technique used for its determination. However, often the ζ-potential is not the only property electrokinetically characterizing the electrical state of the interfacial region; the excess conductivity of the stagnant layer is an additional parameter. The requirement to obtain the ζ-potential is that electrokinetic theories be correctly used and applied within their range of validity. Basic theories and their application ranges are discussed. A thorough description of the main electrokinetic methods is given; special attention is paid to their ranges of applicability as well as to the validity of the underlying theoretical models. Electrokinetic consistency tests are proposed in order to assess the validity of the ζ-potentials obtained. The recommendations given in the report apply mainly to smooth and homogeneous solid particles and plugs in aqueous systems; some attention is paid to nonaqueous media and less ideal surfaces.

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The Electrical Double Layer on Gold Probed by Electrokinetic and Surface Force Measurements

Cited by 137 publications

References 36 publications

Force measurements with the atomic force microscope: Technique, interpretation and applications

Force measurements with the atomic force microscope: Technique, interpretation and applications

Dispersion forces acting between silica particles across water: influence of nanoscale roughness

Measurement and Interpretation of Electrokinetic Phenomena (IUPAC Technical Report)

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