2013
DOI: 10.1016/j.actamat.2013.01.029
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The effects of defects in purple AuAl2 thin films

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Cited by 15 publications
(8 citation statements)
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“…The difference between measured and modeled values reflects the contribution from scattering at point defects (i.e. vacancies and incorporated Ar atoms) [46]. For the as-deposited films, the measured resistivity values of the ND-Cu and 0.05 keV IBAD-Cu films are very close to the modeled ones, indicating that these films are virtually free of point defects.…”
Section: Electrical Resistivity and Defect Concentrationmentioning
confidence: 79%
See 2 more Smart Citations
“…The difference between measured and modeled values reflects the contribution from scattering at point defects (i.e. vacancies and incorporated Ar atoms) [46]. For the as-deposited films, the measured resistivity values of the ND-Cu and 0.05 keV IBAD-Cu films are very close to the modeled ones, indicating that these films are virtually free of point defects.…”
Section: Electrical Resistivity and Defect Concentrationmentioning
confidence: 79%
“…On the basis of the difference between the measured and modeled resistivity values, one can calculate the point defect concentration if the resistivity increment per point defect is known [46]. The values for a single vacancy and Ar atom were experimentally measured to be 1.3-1.5 Â 10 À8 Ohm m at.% À1 [47,48] and 1.74 Â 10 À8 Ohm m at.% À1 [35], respectively.…”
Section: Electrical Resistivity and Defect Concentrationmentioning
confidence: 99%
See 1 more Smart Citation
“…Since sputtering causes defects in the structure, the as-sputtered films were subsequently annealed at 330°C for 10 min to reduce defects and hence to reveal color (Fig. 2), the same parameters as Furrer et al [18]. The thin film library composition was compared to the bulk samples.…”
Section: Methodsmentioning
confidence: 99%
“…Conventional colorant-pigments have a typical intrinsic color, but they easily fade because of chemical inactivation under prolonged illumination. [11,12] The next category is a structured color filter based on surface plasmon resonance effects, which is a periodic subwavelength array of nanocavity structures that absorb visible light over a range of wavelengths. [13][14][15][16][17][18][19] The most commonly used design is metal-insulator-metal (MIM) film stacks, where the layer is nanopatterned by complicated lithographic procedures.…”
Section: Introductionmentioning
confidence: 99%