2001
DOI: 10.1002/1099-1476(20010125)24:2<81::aid-mma198>3.3.co;2-o
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The combined relaxation and vanishing Debye length limit in the hydrodynamic model for semiconductors

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Cited by 11 publications

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“…This model was also obtained in similar scalings from drift diffusion models (see [4], [7]) and from hydrodynamic models [8]. This model was also obtained in similar scalings from drift diffusion models (see [4], [7]) and from hydrodynamic models [8].…”
Section: Drift Scaling
supporting
confidence: 72%