The Clean Sheet induced Contamination and their corresponding Failure Analysis

Hsieh, W. F.; Lin, Henry; Chen, Vincent; Ou, Irene; Hsu, Fu-Wang; Lou, Y. S.

doi:10.1109/ipfa49335.2020.9260702

2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2020

DOI: 10.1109/ipfa49335.2020.9260702

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The Clean Sheet induced Contamination and their corresponding Failure Analysis

W. F. Hsieh¹,

Henry Lin²,

Vincent Chen³

et al.

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The Clean Sheet induced Contamination and their corresponding Failure Analysis

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