The calculation of radial dose from heavy ions: predictions of biological action cross sections

Katz, Robert; Cucinotta, Francis A.; Zhang, C.X.

doi:10.1016/0168-583x(95)01011-4

Cited by 40 publications

(26 citation statements)

References 20 publications

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“…However, this strategy is in line with other modeling approaches as reported e.g. in [30][31][32][33] that despite of their biological simplifications allow to represent the major aspects of radiation effects surprisingly well.…”

Section: Representation Of Cell-cycle Effectsmentioning

confidence: 82%

The link between cell-cycle dependent radiosensitivity and repair pathways: A model based on the local, sister-chromatid conformation dependent switch between NHEJ and HR

et al. 2015

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Section: Representation Of Cell-cycle Effectsmentioning

confidence: 82%

The link between cell-cycle dependent radiosensitivity and repair pathways: A model based on the local, sister-chromatid conformation dependent switch between NHEJ and HR

et al. 2015

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“…Heavy ions have track a radius much smaller than the feature sizes of current technologies. For example, 99% of the energy of a 1-GeV carbon ion is deposited in its track within a radius of about 2 nm in silicon, according to the calculation of the radial dose from heavy ions in [8]. Conversely, the laser spot is usually at the range of tens of micormeters.…”

Section: A Heavy-ion Fault Injectionmentioning

confidence: 99%

Heavy-Ion Microbeam Fault Injection into SRAM-Based FPGA Implementations of Cryptographic Circuits

Shao

et al. 2015

IEEE Trans. Nucl. Sci.

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Transistors hit by heavy ions may conduct transiently, thereby introducing transient logic errors. Attackers can exploit these abnormal behaviors and extract sensitive information from the electronic devices. This paper demonstrates an ion irradiation fault injection attack experiment into a cryptographic field-programmable gate-array (FPGA) circuit. The experiment proved that the commercial FPGA chip is vulnerable to low-linear energy transfer carbon irradiation, and the attack can cause the leakage of secret key bits. A statistical model is established to estimate the possibility of an effective fault injection attack on cryptographic integrated circuits. The model incorporates the effects from temporal, spatial, and logical probability of an effective attack on the cryptographic circuits. The rate of successful attack calculated from the model conforms well to the experimental results. This quantitative success rate model can help evaluate security risk for designers as well as for the third-party assessment organizations. Index Terms-Cryptographic integrated circuits, fault injection, heavy ion, microbeam, single-event transient (SET).

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“…Here, we do not specify which specific functional group is involved and consider the whole detector material as target assembly. We use the postulate that, in plastics only SMVs in state 'Yes' as centres of active etching, are involved in the etching process (Katz, 1983;Katz et al, 1996). A change from state "No" to state "Yes" occurs by the number of hits from -electrons, which is equal or greater than a critical number .…”

Section: First Approximation Of Many-hit Model (Rel Consideration)mentioning

confidence: 99%

The Bragg-peak studies in CR-39 SSNTD on the basis of many-hit model for track etch rates

Ditlov

Awad

Fromm

et al. 2005

Radiation Measurements

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The calculation of radial dose from heavy ions: predictions of biological action cross sections

Cited by 40 publications

References 20 publications

The link between cell-cycle dependent radiosensitivity and repair pathways: A model based on the local, sister-chromatid conformation dependent switch between NHEJ and HR

The link between cell-cycle dependent radiosensitivity and repair pathways: A model based on the local, sister-chromatid conformation dependent switch between NHEJ and HR

Heavy-Ion Microbeam Fault Injection into SRAM-Based FPGA Implementations of Cryptographic Circuits

The Bragg-peak studies in CR-39 SSNTD on the basis of many-hit model for track etch rates

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