In order to redefine the kilogram, the Avogadro constant is determined by means of the X-ray crystal density method, where the lattice constant, density and mean molar mass of a single crystal silicon sphere are absolutely measured [1]. The density of the silicon sphere, whose diameter and mass are approximately 93.6 mm and 1 kg respectively, is obtained by the accurate diameter and mass. To measure the absolute diameter, laser interferometry is the most promising method with nanometer resolutions and traceable measurement results. However, the 2π ambiguity range limits the measurement range. In this contribution, a chain of temporal synthetic wavelengths, generated by use of a frequency-tunable diode laser calibrated by an optical frequency comb, is used to measure the absolute diameter with an accuracy of 3 nm in air, where the fractional interference phase is measured by phase-shifting interferometry.As shown in Fig. 1 (a), the diameter of the silicon sphere D can be expressed as D=L-(d 1 +d 2 ), where the length of the etalon L and the two gaps between the surface of the etalon and the adjacent of the sphere d 1 and d 2 are measured by analysing the interference fringes, respectively. The reference plates are fixed at the outside surface of the etalon, made of ultralow expansion glass, by optical wringing. The two surfaces of each reference plate have a wedge of 42 minutes of arc to eliminate the spurious reflection. The angle between the reference surfaces is better than 10 second of arc corresponding to a diameter measurement error of ~0.1 nm. The nominal diameter and the length of the etalon are 93.62 μm and 108.01 μm, respectively, measured by a coordinate measuring machine. To achieve an accuracy of nanometer level, laser interferometry is used to measure the interference phase.To extend the unambiguous range and determine the absolute distance using interferometry, methods based on generating synthetic wavelengths larger than the laser wavelength are presented [2]. In multiple wavelength interferometry, the absolute distance is expressed as L=λ s (ΔN +Δε)/2, where λ s =λ i λ j /(λ i -λ j ) is the temporal synthetic wavelength generated by single wavelengths of λ i and λ j , ΔN and Δε are the variations of the normalized integral and fractional phases, respectively. Thus, using an effective variable synthetic wavelength, the measurement range is proportional to λ s and the accuracy is relevant to the single laser wavelength and the accuracy of the interference phase measurement. To enhance the phase measurement accuracy in phase-shifting interferometry, a frequency-tunable diode laser (ECDL) calibrated by an optical frequency comb (OFC) is used to produce accurate phase steps by changing the laser frequency, as shown in Fig. 1 (b) [3]. With this technique, phase measurement uncertainties from the laser frequency and phase steps are negligible. Fig. 1 (b) Schematic of the diameter determination interferometer. (a) Schematic of the arbitrary single optical frequency synthesizer.