DOI: 10.1109/date.2003.1253793
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Abstract: In a large circuit it is common to find that an output of the circuit depends structurally on a proper subset of the circuit inputs. We use this observation to provide test data compression. The proposed approach can be used in addition to test data compression techniques based on encoding.Structural output dependence is utilized in this work to provide data compression as follows. Consider a test set T that needs to be applied to the circuit. Suppose that the circuit inputs can be divided into subsets A 0 ,A…

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