Temperature measurement in Content Addressable Memory cells using bias-controlled VCO

Datta, Basab; Burleson, Wayne

doi:10.1109/socc.2008.4641499

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2011

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“…The test temperature was converted by a BJT-based thermal sensor into a voltage or current signal first, and then the corresponding ADC was utilized for subsequent output coding [10][11][12][13]. An ADC with more than 10 output bits was usually required to obtain the needed resolution.…”

Section: Introductionmentioning

confidence: 99%

A high resolution temperature detection circuit

Liao

Lin

2011

2011 8th International Conference on Information, Communications &Amp; Signal Processing

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This paper presents a temperature detection circuit implemented in 0.35-ȝm CMOS fabrication process. Different from the conventional circuits, we use a voltage-tofrequency converter to replace the traditional Analog-to-Digital converter (ADC). With the voltage-to-frequency converter, the resolution is improved. Simulation results show that the proposed architecture can reach a resolution less than 0.1 with ± 0.01 errors for sensing ranges between -40 and 125 .

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Section: Introductionmentioning

confidence: 99%