2022
DOI: 10.1007/s10854-022-08206-9
|View full text |Cite
|
Sign up to set email alerts
|

Temperature induced low voltage write-once-read-many resistive switching in Ag/BTO/Ag thin films

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2022
2022
2024
2024

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 5 publications
(1 citation statement)
references
References 20 publications
0
1
0
Order By: Relevance
“…The device retains its LRS i.e., ON state permanently showing WORM behavior. 81,82 Cross-sectional view of the SEM image of the Au/Indole2-SA/ ITO clearly depicts the presence of Au, ITO as well as Indole2-SA active layer within the device (Fig. 5f) and measured thickness of the active layer was 380 nm.…”
Section: Resultsmentioning
confidence: 97%
“…The device retains its LRS i.e., ON state permanently showing WORM behavior. 81,82 Cross-sectional view of the SEM image of the Au/Indole2-SA/ ITO clearly depicts the presence of Au, ITO as well as Indole2-SA active layer within the device (Fig. 5f) and measured thickness of the active layer was 380 nm.…”
Section: Resultsmentioning
confidence: 97%