DOI: 10.1109/date.2003.1253658
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Abstract: Charge Pump Phase locked loops are used in a variety of applications, including on chip clock synthesis, symbol timing recovery for serial data streams, and generation of frequency agile high frequency carrier signals. In many applications PLL's are embedded into larger digital systems, in consequence, analogue test access is often limited. Test motivation is thus towards methods that can either aid digital only test of the PLL, or alternatively facilitate complete self testing of the PLL. One useful characte…

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