2022
DOI: 10.1063/5.0093076
|View full text |Cite
|
Sign up to set email alerts
|

TCAD augmented generative adversarial network for hot-spot detection and mask-layout optimization in a large area HARC etching process

Abstract: Cost-effective vertical etching of plug holes and word lines is crucial in enhancing 3D NAND device manufacturability. Even though multiscale technology computer-aided design (TCAD) methodology is suitable for effectively predicting etching processes and optimizing recipes, it is highly time-consuming. This article demonstrates that our deep learning platform called TCAD-augmented Generative Adversarial Network can reduce the computational load by 2 600 000 times. In addition, because well-calibrated TCAD data… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2022
2022
2023
2023

Publication Types

Select...
4

Relationship

2
2

Authors

Journals

citations
Cited by 4 publications
(1 citation statement)
references
References 23 publications
0
1
0
Order By: Relevance
“…In this paper, we will use a DG model based on GANs and a generator consisting of RNN models, along with improvements to the data model [20][21][22], so that the limitations of the time-series data module can be effectively addressed.…”
Section: Gans-based Alarm Data Enhancement For Communication Networkmentioning
confidence: 99%
“…In this paper, we will use a DG model based on GANs and a generator consisting of RNN models, along with improvements to the data model [20][21][22], so that the limitations of the time-series data module can be effectively addressed.…”
Section: Gans-based Alarm Data Enhancement For Communication Networkmentioning
confidence: 99%