Isotopic labeling (deuteration) is known to affect the phase behavior of polystyrene (PS) and poly-(methyl methacrylate) (PMMA) blends, but little is known regarding the changes in the interfacial properties at the PS/PMMA interface due to deuteration of PS and/or PMMA. To investigate these potential changes, secondary ion mass spectrometry (SIMS) was used to measure real-space depth profiles of dPS in hPS:dPS/hPMMA bilayers, with the hPS:dPS blend being well within the single-phase region of the phase diagram. Profound changes in the thermodynamic behavior of this system at the polymer/polymer interface are observed in the form of significant segregation of dPS to the hPS:dPS/hPMMA interface. The observation of a depletion hole during the formation of an equilibrium excess of dPS implies that the energetic gain at the interface per dPS chain has to be >kT. These results cannot be described, even qualitatively, using previously reported changes in for PS/PMMA due to isotopic labeling. The previously reported values of for dPS/hPMMA and hPS/hPMMA actually predict a depletion of dPS at the hPS:dPS/hPMMA interface rather than the observed segregation. The observed interfacial excess is quantified by generating theoretical profiles, using self-consistent mean-field theory (SCMF), and fitting an effective interaction energy parameter ∆ p as a function of temperature. This parameter represents the asymmetry in dPS/hPMMA and hPS/PMMA interactions. The temperature dependency of ∆ p was found to be a factor of 3-4 greater than any of those reported for of PS/PMMA. It was also found that SCMF theory accurately describes the concentration dependency of dPS segregation at a constant dPS molecular weight using a concentration-independent ∆ p ; however, ∆ p was found to be dependent on dPS molecular weight.