1997
DOI: 10.1016/s0032-3861(96)00661-1
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Surface fluorination of PEEK film by selective wet-chemistry

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1997
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Cited by 33 publications
(15 citation statements)
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“…19,20 Using the wet-chemistry technique, 21 we have already prepared and characterized a reduced PEEK film displaying a high density of hydroxyl functions on its surface (sample called PEEK-OH; Scheme 1). 15,16 The PEEK-OH reactivity has been assayed by direct derivatization with a 3 H-label ( 3 H-acetic anhydride), and by indirect derivatization (activation with p-nitrophenyl chloroformate, then reaction with 3 H-lysine), followed by liquid scintillation counting ( LSC ) of the sampleassociated radioactivity. 15 The PEEK-OH film has been designed as a versatile starting metarial for the development of several fluorination processes.…”
Section: Introductionmentioning
confidence: 99%
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“…19,20 Using the wet-chemistry technique, 21 we have already prepared and characterized a reduced PEEK film displaying a high density of hydroxyl functions on its surface (sample called PEEK-OH; Scheme 1). 15,16 The PEEK-OH reactivity has been assayed by direct derivatization with a 3 H-label ( 3 H-acetic anhydride), and by indirect derivatization (activation with p-nitrophenyl chloroformate, then reaction with 3 H-lysine), followed by liquid scintillation counting ( LSC ) of the sampleassociated radioactivity. 15 The PEEK-OH film has been designed as a versatile starting metarial for the development of several fluorination processes.…”
Section: Introductionmentioning
confidence: 99%
“…15 The PEEK-OH film has been designed as a versatile starting metarial for the development of several fluorination processes. 16 In this article, we further describe the use of PEEK-OH as a key-intermediate 22,23 for the coupling of a a-v-bifunctional spacer arm allowing the covalent anchorage of various molecules of interest. Our objectives are (a) to display amine and/or carboxyl functions on the PEEK surface (Bornem, Belgium) an used as received.…”
Section: Introductionmentioning
confidence: 99%
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“…43 The tagging of PEEK-OH 6 with DAST gave the PEEK-F Ðlm (Scheme 1) ; XPS analysis showed an F/C atomic ratio of 0.0388, corresponding to 74% of derivatization. 43 The ToF-SIMS analyses of the PEEK-OH 1È3 samples have been performed. The di †erences between the native PEEK and the reduced polymers appear somewhat tenuous.…”
Section: Surface Reduction Of Peek ðLm To Peek-oh30mentioning
confidence: 99%