1990
DOI: 10.1002/sia.740160175
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Surface characterization of Cux/2Cd1−xIn2+x/2S4 model catalysts

Abstract: The sulpbospinels reported in the title, with x ranging from 0 to 1.0, were characterized by bulk and surface techniqnes (XRD, magnetic susceptibility, reflectance spectroscopy and XPS, including x-ray induced Auger SPeetr~OPY).Homogeneous spinel solid solutions are formed up to x = 0.4, whereas for the other compositions the CuInS, Only monovalent copper was found in aU the samples, in the bulk as well as on the surface.The surface of the solphospinels is stable to air; on the contrary, the surface of CuS is … Show more

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Cited by 11 publications
(3 citation statements)
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“…Only one sulfur species is observed. The binding energy of 161.8 eV ± 0.1 eV for the 2p 3/2 sublevel is in good agreement with the binding energy of the S 2p 3/2 level measured in bulk CdS. , Neither is it possible in our spectra to distinguish between S in CdS and in HgS nor can a distinct surface environment be seen.
5 High resolution spectrum of the S 2p core level of CdS/HgS/CdS nanocrystals at a surface sensitive energy.
…”
Section: Resultssupporting
confidence: 87%
“…Only one sulfur species is observed. The binding energy of 161.8 eV ± 0.1 eV for the 2p 3/2 sublevel is in good agreement with the binding energy of the S 2p 3/2 level measured in bulk CdS. , Neither is it possible in our spectra to distinguish between S in CdS and in HgS nor can a distinct surface environment be seen.
5 High resolution spectrum of the S 2p core level of CdS/HgS/CdS nanocrystals at a surface sensitive energy.
…”
Section: Resultssupporting
confidence: 87%
“…33,34 Similarly the sulphur present in the CIS is in agreement with the literature values for S 2À . 35 These oxidation states reflect a neutral stoichiometric CIS product.…”
Section: X-ray Diffractionmentioning
confidence: 99%
“…The S 2p photoelectron peak lies at 162.4 eV, also in the vicinity of the BE values characteristic of CdS [15,16]. The sample composition indicates an enrichment of the film surface by sulphur (S:Cd = 1.24), with respect to the CdS stoichiometry.…”
Section: Resultsmentioning
confidence: 95%