Summary Abstract: Small-angle x-ray scattering study of thin Au films

Levine, Joanne R.; Chung, Yip‐Wah; Cohen, J. B.; Georgopoulous, P.

doi:10.1116/1.575292

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Summary Abstract: Small-angle x-ray scattering study of thin Au films

Abstract: Articles you may be interested inStructure and property characterization of low-k dielectric porous thin films determined by x-ray reflectivity and small-angle neutron scattering AIP Conf.

Cited by 2 publications

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Ultra-High Vacuum Grazing Incidence Small Angle X-ray Scattering Camera for in Situ Surface Analysis

Ultra-High Vacuum Grazing Incidence Small Angle X-ray Scattering Camera for in Situ Surface Analysis

Ultra-High Vacuum Grazing Incidence Small Angle X-Ray Scattering Camera for in Situ Surface Analysis

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