2015
DOI: 10.1002/pssb.201552249
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Suitability of SnS thin films for photovoltaic application due to the existence of persistent photocurrent

Abstract: Tin Sulphide is a layered compound which retains its structure when deposited as thin films by thermal evaporation. The films were found to have oriented growth with the direction of orientation changing with film thickness. The film's morphology was found to change with orientation. The poor conductivity of the thicker samples made it difficult to make photocunductivity characterisation. However, unlike reported the thinner samples showed photo-sensitivity to be independent of film thickness and grain size wi… Show more

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Cited by 23 publications
(9 citation statements)
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References 53 publications
(80 reference statements)
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“…However, X‐ray diffractogram corresponding to 1175 nm showed a drastic decrease in X‐ray peak intensities. This decrease in XRD peak intensities could be due to the change in crystal orientation or grain morphology in SnS thin films expected in films of this thickness based on our observations reported earlier . SnS films showed crystallinity with crystallite sizes in the nanoregime (≈20–30 nm).…”
Section: Resultssupporting
confidence: 75%
See 1 more Smart Citation
“…However, X‐ray diffractogram corresponding to 1175 nm showed a drastic decrease in X‐ray peak intensities. This decrease in XRD peak intensities could be due to the change in crystal orientation or grain morphology in SnS thin films expected in films of this thickness based on our observations reported earlier . SnS films showed crystallinity with crystallite sizes in the nanoregime (≈20–30 nm).…”
Section: Resultssupporting
confidence: 75%
“…This decrease in XRD peak intensities could be due to the change in crystal orientation or grain morphology in SnS thin films expected in films of this thickness based on our observations reported earlier. [21] SnS films showed crystallinity with crystallite sizes in the nanoregime (≈20-30 nm). Within experimental error, we may consider that there is small or negligible variation in crystallite size with film thickness.…”
Section: Structural Analysismentioning
confidence: 99%
“…9B) also confirms the effect of Urbach tail defects on the optical behavior of the as grown p-SnS films (over a larger wavelength region). These results validate our persistent photocurrent (PPC) results [12] where thinner samples showed a single exponential decay curve due to small width of levels while as the width increased, multiple transition levels appeared and a non-exponential decay curve was observed.…”
Section: Refractive Indexsupporting
confidence: 88%
“…
extensive applications such as optoelectronic memory, [1,2] light-enhanced gas sensing, [3][4][5] imaging, [6] photocatalysis, [7,8] photovoltaics, [9,10] and radiation detection. [11] However, thus far, the majority of researchers focus on the conventional rapid photoswitching, [12][13][14][15][16] while PPC phenomena have attracted much less attention.
…”
mentioning
confidence: 99%