Suicide in Brighton

Abstract

The County Borough of Brighton is a seaside town with a population at the 1971 census of 166,081. This population has fluctuated only slightly. In 1951, the total population was 156,486; in 1961 it was 163,159; in 1966 it was 159,510. Brighton's population contains a large percentage of elderly people; in 1966 there were 25 · 7 per cent of the population over the age of 60, and 18 · 8 per cent were over 65 years old, compared with 18 per cent over 60, and 12 per cent over 65 for England and Wales.

Suicide in the medically and terminally ill: Psychological and ethical considerations

“…The studies reviewed used the psychological-autopsy method, and the number of suicides in the majority of them was greater than 100 (e.g., 170 completed suicides in the study by Jacobsen & Jacobsen, 1972). Estimates of the prevalence of medical illness in these samples varied greatly from 18% (Edwards & Whitlock, 1968a;1968b) to 70% (Dorpat & Ripley, 1960;Stewart, 1960).…”

Investigations of spatial distributions of intensity of radiation reflected from thin films which are inhomogeneous over thickness

“…Because no interference occurs between radiation of beams a ected by internal re¯ection in the thicksubstrate, the total radiation intensity re¯ected from the sample is given by a single sum [9] of the radiation intensities of several components (® gure 1). Therefore the total intensity is described by the following function of distance x from the axis of a beam re¯ected in the point of radiation incidence upon a sample (® gure 1): (4) where…”

“…The subscript v must be replaced by p and s for the appropriately polarized radiation Iv(nf, a f ,n,a ,nb,a b, w,s C , µ , µ dj) represents the intensity of re¯ected radiation calculated using equation (4) for appropriate values of nf , a f , n, a , nb, ab, w, s w, µ and µ dj. that the results obtained in di erent experiments correspond to each other.…”

“…It should be noted that investigations of the optical inhomogeneity of thin ® lms of a-Si should be taken into serious consideration for optimized technological conditions. Equation (4) does not describe the in¯uence of multiple internal re¯ection of radiation in the thin ® lm on the spatial distribution of re¯ected radiation. This e ect can be neglected owing to the very small thickness of a thin ® lm in comparison with the thick substrate thickness.…”

“…chemical composition and temperature) strongly in¯uences the values of the optical parameters of thin ® lms. The values of the real part of the refractive index and absorption coe cient vary with the depth in the thin semiconductor ® lm [4,5]. Their changes are particularly large near the air± semiconductor ® lm and semiconductor± substrate interfaces.…”