Characterization: Reflectance Fourier-transform spectra were recorded on a Thermo Nicolet Nexus 670 spectrometer. Ellipsometric measurements of dried brushes were obtained with a custom-built nullellipsometer with a He±Ne laser (632.8 nm) light source and a 70.0 angle of incidence. Atomic force microscopy (AFM) images were obtained by contact mode and tapping mode imaging using V-shaped silicon nitride cantilevers (NanoProbe, Veeco, Santa Barbara, CA; spring constant 0.12 N m ±1 , tip radius 20±60 nm) using a MultiMode scanning probe microscope (SPM) and a Dimension 3100 SPM (Veeco, Santa Barbara, CA). Topographic imaging was performed in air, in water, and in water±MeOH (1:1, vol./vol.) mixtures using a fluid cell. Image forces were kept below 1 nN to minimize compression and damage to polymer brushes. All SEM images were taken at 30 kV (accelerating voltage)