2012
DOI: 10.1039/c2sm06982b
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Substrate and drying effect in shape and ordering of micelles inside CTAB–silica mesostructured films

Abstract: Deviation from a perfect 2D-hexagonal (p6m) structure, for CTAB-silica mesostructured films prepared by adding different amounts of excess ethanol to a solution of CTAB and TEOS just before spin coating on OH-and H-terminated Si substrates, is observed from combined X-ray reflectivity and grazing incidence small angle X-ray scattering measurements. Such a deviation can be well understood in terms of the shape and ordering of the micelles, with or without the silica coating layer's contribution, inside the film… Show more

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Cited by 23 publications
(49 citation statements)
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“…In the case of the laboratory experiments, the different siloxane molecules are deposited onto the glass slides by spin-coating. This procedure is adopted since it provides a stable and reproducible coating [34,43], easily adoptable in the common practice [44,45]. Actually, it is a procedure comparable to the coating methods adopted in industrial applications [5].…”
Section: Wetting Behavior Of Bare Siloxane Layersmentioning
confidence: 99%
“…In the case of the laboratory experiments, the different siloxane molecules are deposited onto the glass slides by spin-coating. This procedure is adopted since it provides a stable and reproducible coating [34,43], easily adoptable in the common practice [44,45]. Actually, it is a procedure comparable to the coating methods adopted in industrial applications [5].…”
Section: Wetting Behavior Of Bare Siloxane Layersmentioning
confidence: 99%
“…[38][39][40][41][42] In short, Si substrates (of size about 15 Â 15 mm 2 ) were first sonicated in acetone and ethanol solutions to remove organic contaminants and subsequently etched with hydrogen fluoride [HF, Merck, 10%] solution for 60 s at room temperature (25 1C) to terminate the Si surface with H after removing the native oxide layer. Chloroform (CF, CHCl 3 ) and toluene (TL, C 7 H 8 ) were obtained from Merck and chlorobenzene (CB, C 6 H 5 Cl) was obtained from Sigma-Aldrich.…”
Section: Methodsmentioning
confidence: 99%
“…9,40,42,43 VXRD consists of a diffractometer (D8 Discover, Bruker AXS) with a Cu source (sealed tube) followed by a Göbel mirror to select and enhance Cu Ka radiation (l = 1.54 Å). 9,40,42,43 VXRD consists of a diffractometer (D8 Discover, Bruker AXS) with a Cu source (sealed tube) followed by a Göbel mirror to select and enhance Cu Ka radiation (l = 1.54 Å).…”
Section: Methodsmentioning
confidence: 99%
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“…Figure shows the scattering pattern observed for the Gemini‐templated PMO. The deduced pore organization is a distorted p6 m which has been shown to correspond better to a c2 mm space group . The distortion is the result of a uniaxial shrinkage normal to the stiff Si substrate.…”
Section: Figurementioning
confidence: 99%