2009 International Semiconductor Conference 2009
DOI: 10.1109/smicnd.2009.5336678
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Study of the temperature dependence of the dark currents non-uniformity for some video-camera chips

Abstract: In order to explain the experimentally found nonuniformity of the dark currents corresponding to different pixels of a video-camera chip, there were accomplished: a) a numerical study of the temperature dependence of the dark currents, in order to find the most convenient theoretical model which can describe sufficiently accurate the experimental data, b) the evaluation of the basic parameters of the studied pixels, corresponding to the chosen theoretical model, c) the study of the correlation between these pa… Show more

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“…As it results from Table 1, the most important versions of the dark current spectroscopy are (i) the classical one (basic work [28], and some of its most important applications [14b-14f]), (ii) the DCS computational approach (represented mainly by the works leading to the evaluation of the (iia) preexponential factors of the diffusion and depletion dark currents [36][37][38], (iib) activation energy [47,48], as well as the study of the: (iic) Meyer-Neldel corelations [49][50][51], (iid) choice and evaluation of the basic uniqueness parameters [52][53][54], and (iie) hidden corelations in complex semiconductors [55,56]).…”
Section: Short Review Of the Main Experimental Methods Used To Characmentioning
confidence: 99%
“…As it results from Table 1, the most important versions of the dark current spectroscopy are (i) the classical one (basic work [28], and some of its most important applications [14b-14f]), (ii) the DCS computational approach (represented mainly by the works leading to the evaluation of the (iia) preexponential factors of the diffusion and depletion dark currents [36][37][38], (iib) activation energy [47,48], as well as the study of the: (iic) Meyer-Neldel corelations [49][50][51], (iid) choice and evaluation of the basic uniqueness parameters [52][53][54], and (iie) hidden corelations in complex semiconductors [55,56]).…”
Section: Short Review Of the Main Experimental Methods Used To Characmentioning
confidence: 99%