2004
DOI: 10.1016/j.matlet.2003.10.015
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Structure and microstructural characteristics in the thin films of La1−xSrxMnO3 (x = 0.1, 0.2, 0.3)

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Cited by 10 publications
(10 citation statements)
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References 24 publications
(20 reference statements)
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“…These findings indicate that, in a certain range of doping, the magnetic properties are closely related with doping x. According to our previous studies [14], the structure and microstructure of the CMR oxides, whether in thin films or bulk, are related to the doping level x. Therefore, there must be a link between microstructure and magnetic properties in these oxides, which is worthwhile to establish for all the CMR oxides.…”
Section: Introductionmentioning
confidence: 51%
See 1 more Smart Citation
“…These findings indicate that, in a certain range of doping, the magnetic properties are closely related with doping x. According to our previous studies [14], the structure and microstructure of the CMR oxides, whether in thin films or bulk, are related to the doping level x. Therefore, there must be a link between microstructure and magnetic properties in these oxides, which is worthwhile to establish for all the CMR oxides.…”
Section: Introductionmentioning
confidence: 51%
“…All these phases have slightly deformed perovskite structure owing to the distortion of the MnO 6 octahedra. Furthermore, microstructural characteristics in thin films of these oxides are generally recognized to be domain-oriented [11][12][13][14], no matter whether the crystal is orthorhombic or rhombohedral. It was also reported that the crystallographic domain orientation might play a very important role in getting magnetic anisotropy [15].…”
Section: Introductionmentioning
confidence: 99%
“…So the columnar grain size is larger in the film deposited at 1073K than at 873K, which is consistent with the results reported by Wang et al [11,12]. 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 The formation of oriented domains of Pnma structure has been largely reported not only in La 1-x R x MnO 3 (R= Ca, Sr or vacancy) thin films [13][14][15][16][17][18][19][20][21][22][23][24][25], but also reported in A 1-x R x MnO 3 ( A=Pr or La; B= Sr or Ca) bulk materials [26,27].…”
Section: Electron Diffraction Patterns and High-resolution Electron Mmentioning
confidence: 99%
“…[9][10][11][12][13] Transmission electron microscopy (TEM) is a powerful tool for characterization of microstructures in materials. In the past few years TEM has been widely applied in the studies of CMR materials, and particularly in thin films of external-doped lanthanum manganites [13][14][15][16][17][18][19][20][21][22][23][24][25][26][27][28]. Van Tendeloo et al [15] Figure 1 shows the low magnification TEM images taken from the crosssectional samples of the two films.…”
Section: Introductionmentioning
confidence: 99%
“…Heteroepitaxial LSMO/(001)STO exhibit a small lattice misfit of 0.945% or À0.95%. On an exact (001) STO substrate, the formation of oriented domains is believed to release the strain [11]. As to the films on vicinal substrates, high strain energy should remain in single-domain films [12].…”
Section: Introductionmentioning
confidence: 99%