Structural Studies of Thermally Evaporated Thin Films of Copper Phthalocyanine

Hassan, A. K.; Gould, R.D.

doi:10.1002/pssa.2211320110

Cited by 88 publications

(58 citation statements)

References 20 publications

(26 reference statements)

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“…where λ is the X-ray wavelength (1.540 Å), β 0 the full width at half maximum (FWHM) of the most intense peak in radians, θ Bragg's angle and k S the Scherrer's constant = 0.9 [19]. The mean crystalline size was calculated to be about 82 nm which is in quite good agreement with the estimated value obtained from FE-SEM images.…”

Section: Methodssupporting

confidence: 80%

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Morphology, Optical and AC Electrical Properties of Copper Phthalocyanine Thin Films

2014

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AC electrical properties of sandwich devices composed of thermally evaporated thin lms of copper phthalocyanine (CuPc) with aluminum and gold electrodes (Al/CuPc/Au) are investigated over frequency (f ) range of 10 2 10 5 Hz and temperature range of 293453 K. Morphology of the samples was studied via eld emission scanning electron microscope images and X-ray diraction micrographs. The X-ray diraction micrograph indicates the conguration of α-CuPc with the (510) plane as the preferred orientation. UVVis absorption spectrum was analyzed and the optical band-gap energy of CuPc thin lm was determined to be 2.81 ± 0.01 eV. Capacitance increased with increasing temperature especially for f = 10 2 Hz. Loss factor decreased considerably with increasing frequency to a minimum value at about f = 10 4 Hz and increased afterwards. Capacitance is generally independent of frequency for T ≤ 413 K; however it decreases remarkably with increasing frequency for T > 413 K. The conductivity increases quite noticeably with increasing frequency particularly for T ≤ 413 K. The AC electrical characteristics are in good agreement with Goswami and Goswami model. According to our data, at high temperatures, the band theory is applicable in describing the conduction process, whereas hopping mechanism is dominant at low temperatures.

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Section: Methodssupporting

confidence: 80%

“…Discrepancies in the relative peak intensities between conventional diraction and X-ray diraction patterns are largely due to the texture eect [18]. The mean crystalline size was calculated by Scherrer's formula [19]:…”

Section: Methodsmentioning

confidence: 99%

Morphology, Optical and AC Electrical Properties of Copper Phthalocyanine Thin Films

2014

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“…All the phases of CuPc represented in Fig. 1a, b, c are polycrystalline in nature as expected for films of thickness higher than 0.1 mm [25]. The peaks in the XRD pattern were fitted to pseudo-Voigt functions and the peak positions were found out.…”

Section: X-ray Diffraction Measurementsmentioning

confidence: 99%

“…Optical properties of CuPc have been studied in thin film form [23]. Many have reported the phase transition aspects on heat treatment using differential scanning calorimetry and infrared absorption spectroscopy [24,25]. Hassan and Gould [25] have reported (001) oriented aCuPc phase for films of thickness 0.1 mm or less.…”

Section: Introductionmentioning

confidence: 99%

Structural Investigation of Copper Phthalocyanine Thin Films Using X-Ray Diffraction, Raman Scattering and Optical Absorption Measurements

Prabakaran¹,

Kesavamoorthy

Reddy

et al. 2002

phys. stat. sol. (b)

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Structural properties of copper phthalocyanine (CuPc) powder and its thin films coated on glass plate are investigated using X-ray diffraction, Raman scattering and optical absorption techniques. These experiments are carried out at room temperature on CuPc powder and as-coated, 320 C and 520 C annealed, CuPc thin films. From the X-ray diffraction (XRD), we find that the CuPc powder exists in monoclinic phase, as-coated film is in orthorhombic a-phase and the film annealed at 320 C exists in monoclinic b-phase with different lattice parameters as compared to those of the powder phase. The XRD peaks in 520 C annealed film do not show the presence of CuPc but indicate the presence of copper oxide (CuO) nanoclusters of approximately 15 nm size. The optical Raman phonon frequencies of CuPc powder, as-coated and 320 C annealed CuPc films show a slight shift in the intramolecular high frequency modes. Whereas, their low frequency Raman spectra from intermolecular modes are characteristically different indicating different phases. The different characteristic behavior of the optical absorption spectra of the as-coated and 320 C annealed CuPc films corroborate the structural changes in the annealed film.

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“…Langemuir-Blodget method (Roberts, 1990), spinoff, painting, and atomisation, which in turn is subdivided into the pneumatic atomisation (Zimmermann et al, 2001), piezoelectric atomisation, or electrospraying (Sarkar et al, 2006). Apart from the methods already listed there are some physical methods applicable to bulk materials, and these include vacuum evaporation: thermal method, electron beam method, and laser ablation (Hassmann, Gould, 1992;Kawalec et al, 2008;Piqué et al, 2003).…”

Section: Introductionmentioning

confidence: 99%

Deposition of Polymer Sensor Films on SAW Surface by Electrospraying Technology

Jasek¹,

Pasternak²,

Grabka³

et al. 2017

Archives of Acoustics

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One of the most important problems with regard to the Surface Acoustic Wave (SAW) gas sensors technology is the deposition of chemosensitive films exhibiting desirable chemical and physical properties. The electrospraying technology seems to be a very promising method of the film deposition in this case. It allows the chemosensitive layers to be obtained out of almost any chemicals and their mixtures in a controllable way. The process gives the possibility to generate specific films with properties unattainable if other methods were to be applied. For example, it allows to deposit solutions of polymers and suspensions of solids in polymer solutions which can degrade in the process of thermal evaporation deposition.The paper describes the results of experiments with electrospraying technique in order to obtain Nafion films. The influence of the process parameters on film sensitivity has been studied.

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Structural Studies of Thermally Evaporated Thin Films of Copper Phthalocyanine

Cited by 88 publications

References 20 publications

Morphology, Optical and AC Electrical Properties of Copper Phthalocyanine Thin Films

Morphology, Optical and AC Electrical Properties of Copper Phthalocyanine Thin Films

Structural Investigation of Copper Phthalocyanine Thin Films Using X-Ray Diffraction, Raman Scattering and Optical Absorption Measurements

Deposition of Polymer Sensor Films on SAW Surface by Electrospraying Technology

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