2006
DOI: 10.1007/bf02914085
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Structural, optical and electrical properties of chemically deposited nonstoichiometric copper indium diselenide films

Abstract: Thin films of copper indium diselenide (CIS) were prepared by chemical bath deposition technique onto glass substrate at temperature, 60°C. The studies on composition, morphology, optical absorption, electrical conductivity and structure of the films were carried out and discussed. Characterization included X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), energy dispersive X-ray analysis (EDAX) and absorption spectroscopy. The results are discussed and interpreted.

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Cited by 17 publications
(4 citation statements)
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“…Figure 5 shows the variation of absorbance with wavelength of nanocrystalline ZnO powder samples. The band gap energies of the samples were calculated from the absorption edges of the spectra [27], which were observed to be slightly varying from 3.36 to 3.42 eV. These values nearly match the reported value of 3.37 eV.…”
Section: Optical Absorptionsupporting
confidence: 64%
“…Figure 5 shows the variation of absorbance with wavelength of nanocrystalline ZnO powder samples. The band gap energies of the samples were calculated from the absorption edges of the spectra [27], which were observed to be slightly varying from 3.36 to 3.42 eV. These values nearly match the reported value of 3.37 eV.…”
Section: Optical Absorptionsupporting
confidence: 64%
“…These CuInSe 2 nanoparticles exhibit a variety of shapes. Both XRD and TEM analyses reveal that the synthesis temperature plays a key role for size control, size distribution and phase purity of CuInSe 2 products [26,27].…”
Section: Structural Analysismentioning
confidence: 99%
“…3.4 Optical absorption Figure 4 shows variation of absorbance with wavelength of nanocrystalline TiO 2 thin films in the range of 300-600 nm. The bandgap energy of the samples was calculated from the absorption edges of the spectra (Bari et al 2006). The bandgap was observed to be slightly varying from 3•28 to 3•29 eV.…”
Section: Microstructure and Electron Diffraction Using Temmentioning
confidence: 99%