2016
DOI: 10.1515/ntrev-2015-0029
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State of the art of metal oxide memristor devices

Abstract: Memristors are one of the emerging technologies that can potentially replace state-of-the-art integrated electronic devices for advanced computing and digital and analog circuit applications including neuromorphic networks. Over the past few years, research and development mostly focused on revolutionizing the metal oxide materials, which are used as core components of the popular metal-insulator-metal memristors owing to their highly recognized resistive switching behavior. This paper outlines the recent adva… Show more

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Cited by 158 publications
(75 citation statements)
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“…Metal filament formation has been the preferred mechanism to explain resistance switching in inorganic memristors (Van den Hurk et al, 2015;Mohammad et al, 2016;Li et al, 2017;Wang et al, 2018), but also in organic ones (He et al, 2009;Sparvoli et al, 2019). According to this model, when a positive voltage is applied to the active electrode, the material is oxidized electrochemically and the resulting cations migrate through the insulating layer up to reach the cathode.…”
Section: Metallic Filamentary Conductionmentioning
confidence: 99%
“…Metal filament formation has been the preferred mechanism to explain resistance switching in inorganic memristors (Van den Hurk et al, 2015;Mohammad et al, 2016;Li et al, 2017;Wang et al, 2018), but also in organic ones (He et al, 2009;Sparvoli et al, 2019). According to this model, when a positive voltage is applied to the active electrode, the material is oxidized electrochemically and the resulting cations migrate through the insulating layer up to reach the cathode.…”
Section: Metallic Filamentary Conductionmentioning
confidence: 99%
“…The considered memristor element is based on HfO 2 material [9,10]. In References [7,8], a model based on physical measurements for transition metal oxide memristors is presented.…”
Section: A Description Of the Proposed Hafnium Dioxide Memristor Modelmentioning
confidence: 99%
“…The optimal values of the fitting model parameters were further used for testing the memristor model in memristor circuits and devices, and for analysis of the basic characteristics, namely current-voltage and state-flux relationships. In Mohammad et al [9], several tentative values of the adjusting parameters α, β, γ, and χ are given. They were applied to start a multi-factor analysis [15,16] of the derived current-voltage characteristics of the hafnium dioxide memristor model.…”
Section: Parameter Estimations Of the Considered Memristor Modelmentioning
confidence: 99%
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“…This is because their existence has been proposed relatively late (1971 by Chua) [1] , its experimental realization came much later, [2] and the mechanisms for the effect are still not fully understood. [3] In particular, a memristor is a resistive component with an inherent memory. Unlike a static resistor, the resistance of a memristor can dynamically be altered by electrical stimuli, resulting in a hysteresis curve in the current-voltage characteristic.…”
Section: Introductionmentioning
confidence: 99%