2008
DOI: 10.1016/j.tsf.2007.10.017
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Sputter-assisted plasma CVD of wide or narrow optical bandgap amorphous CNx:H films using i-C4H10/N2 supermagnetron plasma

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Cited by 7 publications
(5 citation statements)
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References 24 publications
(53 reference statements)
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“…a-C:H and its nitride (a-CN x :H) showed more than ten orders of magnitude difference in room temperature conductivity, depending on the deposition method used [5][6][7]. The proportion of sp 2 hybridized carbon atoms and their clustering in smaller or larger size determine the optical band gap and produce a significant influence on the electrical transport as well [7][8][9].…”
Section: Introductionmentioning
confidence: 99%
“…a-C:H and its nitride (a-CN x :H) showed more than ten orders of magnitude difference in room temperature conductivity, depending on the deposition method used [5][6][7]. The proportion of sp 2 hybridized carbon atoms and their clustering in smaller or larger size determine the optical band gap and produce a significant influence on the electrical transport as well [7][8][9].…”
Section: Introductionmentioning
confidence: 99%
“…These incremental increases were caused by sputter deposits on a counter electrode, i.e., sputtering of reactive species from the upper electrode surface to the lower electrode surface. 13) The optical band gap was measured at a N 2 concentration of 70% as a function of LORF at UPRFs of 50, 200, and 800 W (Fig. 6) The optical band gap increased with a decrease in LORF from 800 to 0 W. In particular, at an LORF of 50 -800 W, the optical band gap changed slightly with UPRF.…”
Section: Resultsmentioning
confidence: 93%
“…Hydrogenated amorphous carbon (a-C:H) films attract interest because their properties are suited to opto-electronic and vacuum microelectronic devices, including light emission diodes, photovoltaic cells and field electron emission devices [1]- [10]. In these films, both the optical and electrical properties can be modified by nitrogen doping; i.e., they are usually regarded as hydrogenated amorphous carbon nitride (a-CN x :H) films [11]- [20]. a-CN x :H films sometimes show high electroconductivity.…”
Section: Introductionmentioning
confidence: 99%
“…Management of the substrate temperature and the intrinsic compressive stress of the films are important factors in the electronic device fabrication. In the continuous discharge of SMP for CVD, the surface temperature of the substrate is easily increased to more than 200˚C by applying RF power [19], which causes the films to peel off from the wafers due to the high intrinsic compressive stress in these films [20].…”
Section: Introductionmentioning
confidence: 99%