Space charge formation in polyimide films and polyimide/SiO2 double-layer measured by LIMM

Locatelli, Marie-Laure; Pham, Congduc; Diaham, Sombel; Berquez, Laurent; Marty-Dessus, Didier; Teyssèdre, G.

doi:10.1109/tdei.2017.006172

Cited by 13 publications

(8 citation statements)

References 47 publications

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“…They also exhibited the stable IDS while displaying chessboard pattern image for 1,800 s. It has been reported that structural defects and chemical impurities arise unavoidably in the polyimide coating process. From this, charges can be generated inside polyimide and these charge distributions depend on electric fields [9], [10]. Since voltage potentials of gate, source, and drain vary according to brightness, there can be electric fields changes inside polyimide.…”

Section: Recoverable Residual Image Of N-efs Tft Based Oled Display Umentioning

confidence: 99%

9‐4: Late‐News Paper: Alleviation of Recoverable Residual Image Phenomenon of Flexible Organic Light‐emitting Diode Display

Hong

Hwang

Hwang³

et al. 2019

Symp Digest of Tech Papers

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These authors contributed equally to this work Abstract Electric field shielding (EFS) layer inserted low-temperature polycrystalline silicon thin-film transistor was suggested to alleviate recoverable residual image phenomenon in organic light-emitting diode display using polyimide substrate. It was found that the recoverable residual image was strongly attributed to charge distribution inside polyimide, and it can be inhibited by EFS.

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Section: Recoverable Residual Image Of N-efs Tft Based Oled Display Umentioning

confidence: 99%

9‐4: Late‐News Paper: Alleviation of Recoverable Residual Image Phenomenon of Flexible Organic Light‐emitting Diode Display

Hong

Hwang

Hwang³

et al. 2019

Symp Digest of Tech Papers

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show abstract

“…In [10], the effect of humidity in air and the difference due to electrode material (Al and Au) on space charge formation with time evolution are discussed. Recently, the Laser Intensity Modulation Method (LIMM) [13] has been performed to investigate space charge characteristics in thin PI films with few micrometers in thickness under the DC field up to 125 kV/mm, close to breakdown voltage [14][15][16][17]. In [17], the space charge characteristics were reported under DC voltage of from low field of 2.5 to 125 kV/mm with the correlation with DC conductivity trends.…”

Section: Introductionmentioning

confidence: 99%

Behavior of Space Charge in Polyimide and the Influence on Power Semiconductor Device Reliability

Tajiri¹,

Muto²,

Marty-Dessus³

et al. 2021

Polyimide for Electronic and Electrical Engineering Applications

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Polyimide is widely used in film form as a passivation material for power semiconductor devices such as Si, SiC, and GaN. The magnitude of the electric field at the edge termination area of these semiconductor devices is becoming higher due to the increase of operational voltage and/or demand for shrinking the edge termination area to increase device active area. Hence, it is concerned that the accumulation of space charge in the encapsulation and passivation material may affect the insulation performance of these devices, for example, the degradation of withstand voltage due to distortion of the internal electric field caused by space charge accumulation. To design space charge resistance of semiconductor devices, it is important to understand the space charge behavior in polyimide films with a thickness of several to several tens of micrometers. This chapter addresses practical implementation, specifications, and issues on space charge in polyimide insulation on power semiconductor devices focusing on the space charge measurements in thin polyimide films using the latest developed LIMM method and DC conductivity measurements.

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“…PI is thermally, chemically and mechanically stable reinforcing its suitability to microelectronics [3]. The isolation properties of PI are affected by several variables including thickness, area, process methods, interfacial electrodes and environmental conditions such as temperature and humidity [4][5][6][7][8][9].…”

Section: Introductionmentioning

confidence: 99%

Electric field DC conductivity dependency of polyimide films

Guinane

Tofail

Stenson

et al. 2020

IEEE Trans. Dielect. Electr. Insul.

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The isolation behaviour of polyimide thin films has been studied. Properties such as DC conductivity and the threshold electrical fields were obtained through a steady state current measurement under an applied voltage across a metal-insulator-metal capacitor. An inverse relationship has been found between the curing temperature and threshold electric field that would be applied to the structure. The results correlate with high voltage endurance lifetime curves for digital isolators processed at different temperatures.

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Space charge formation in polyimide films and polyimide/SiO2 double-layer measured by LIMM

Cited by 13 publications

References 47 publications

9‐4: Late‐News Paper: Alleviation of Recoverable Residual Image Phenomenon of Flexible Organic Light‐emitting Diode Display

9‐4: Late‐News Paper: Alleviation of Recoverable Residual Image Phenomenon of Flexible Organic Light‐emitting Diode Display

Behavior of Space Charge in Polyimide and the Influence on Power Semiconductor Device Reliability

Electric field DC conductivity dependency of polyimide films

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