1987
DOI: 10.1103/physrevb.36.8038
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Solid-phase epitaxy of amorphous silicon induced by electron irradiation at room temperature

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Cited by 68 publications
(41 citation statements)
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“…It was inferred that the electronic excitations and ionizations play practically no role in the recrystallization process Williams et al, 1985). In other experiments, in which a-Si layers were irradiated by the electron-beam, the recrystallization was observed only for energies above a threshold for atomic displacement of ~ 150 keV while below this threshold no epitaxial regrowth was produced, even after irradiation at very high electron doses (Lulli et al, 1987;Miyao et al, 1986;Washburn et al, 1983). Therefore, the observed epitaxy is associated with elastic collisions that transfer sufficient momentum to displace target atoms from their lattice site.…”
Section: Influence Of the Beam Parameters In The Ibiec Processmentioning
confidence: 96%
“…It was inferred that the electronic excitations and ionizations play practically no role in the recrystallization process Williams et al, 1985). In other experiments, in which a-Si layers were irradiated by the electron-beam, the recrystallization was observed only for energies above a threshold for atomic displacement of ~ 150 keV while below this threshold no epitaxial regrowth was produced, even after irradiation at very high electron doses (Lulli et al, 1987;Miyao et al, 1986;Washburn et al, 1983). Therefore, the observed epitaxy is associated with elastic collisions that transfer sufficient momentum to displace target atoms from their lattice site.…”
Section: Influence Of the Beam Parameters In The Ibiec Processmentioning
confidence: 96%
“…The fundamental role of elastic displacement in the mechanism of particle-induced crystallization has been demonstrated both for ion-beam annealing (IBA) Holmdn 1986, Brown et al 1987) and for SPE of implanted Si layers obtained by in situ electron irradiation at room temperature inside a transmission electron microscope (Lulli et al 1987(Lulli et al , 1988. A transition from SPE to amorphization at the a-c interface, resulting in 'epitaxial' growth of the amorphous phase, is observed under ion irradiation, when the temperature is decreased below a critical value which depends on the dose rate Brown 1987, Brown et al 1987).…”
Section: Solid-phase Epitaxy Of Implanted Silicon At Liquid Nitrogen mentioning
confidence: 98%
“…In situ electron-beam irradiation were performed in a CM-30 Philips electron microscope equipped with a system for the measurement of beam current density similar to that already described by Lulli et al (1987). The irradiation procedure was that described in the same work.…”
Section: Solid-phase Epitaxy Of Implanted Silicon At Liquid Nitrogen mentioning
confidence: 99%
“…Electron-beam irradiating techniques have been applied to the fabrication of NWs as well as nano-dots. In addition to e-beam lithography, electron-beam irradiation also enables nanostructures to be individually formed at particular sites where the electron-beam is irradiated by electronbeam induced chemical vapor deposition (EB-CVD); a focused electron-beam was probed at a particular region of the specimen surface on which certain chemicals are adsorbed, and the resultant chemical reaction and/or phase variation may lead to the formation of nano-scale nanostructures at the irradiated spot [3,4].…”
Section: Introductionmentioning
confidence: 99%