2021
DOI: 10.1149/1945-7111/ac0761
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Solid Electrolyte Interphase Architecture Determined through In Situ Neutron Scattering

Abstract: We demonstrate through a combination of in operando solvent exchange and depth-sensitive neutron reflectometry that the solid electrolyte interphase (SEI) formed after the initial lithiation of a silicon anode, using a standard LiPF6 ethylene carbonate/ethyl methyl carbonate electrolyte, is chemically homogeneous across the liquid-solid interface. The data show the SEI is accessible to solvent/salt exchange throughout the layer indicating the poorly bound nature of the SEI components. Further, the data indicat… Show more

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Cited by 7 publications
(4 citation statements)
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“…Using the molecular units of Li 2 O, Li 2 CO 3 , LiCl, and LiOH commonly observed in SEIs on carbon and silicon films, 40,41,58,64,[66][67][68][69][70][71][72] a SEI layer thickness of (38 ± 12) nm is obtained. This value is also in agreement with literature data on carbon and silicon electrodes, 64,66,69,70,[73][74][75][76][77][78][79][80][81][82] even with values obtained from analytical techniques with nanometer resolution such as X-ray reflectometry, 77 NR, 64,73,[77][78][79]83,84 and microscopy. 73,[80][81][82]84 Finally, the charge (lithium) trapped inside the ion-beam sputter deposited films per nm thickness obtained from Fig.…”
Section: Resultssupporting
confidence: 92%
“…Using the molecular units of Li 2 O, Li 2 CO 3 , LiCl, and LiOH commonly observed in SEIs on carbon and silicon films, 40,41,58,64,[66][67][68][69][70][71][72] a SEI layer thickness of (38 ± 12) nm is obtained. This value is also in agreement with literature data on carbon and silicon electrodes, 64,66,69,70,[73][74][75][76][77][78][79][80][81][82] even with values obtained from analytical techniques with nanometer resolution such as X-ray reflectometry, 77 NR, 64,73,[77][78][79]83,84 and microscopy. 73,[80][81][82]84 Finally, the charge (lithium) trapped inside the ion-beam sputter deposited films per nm thickness obtained from Fig.…”
Section: Resultssupporting
confidence: 92%
“…As a scattering technique, NR measures the specular reflection of neutrons from the surface, which changes with the wave vector transfer perpendicular to the sample surface, following the equation Q = [4π sin­(θ)]/λ (where θ represents the angle of incidence of the neutron beam with the sample surface and λ denotes the wavelength of the neutrons). , The thickness, roughness, as well as the layers’ scattering length density (SLD) can be obtained by fitting the reflectivity via layered models, which is informative for determining the layer compositions. Therefore, NR has been increasingly employed for probing the interphasial properties of batteries. , …”
Section: Understanding Fluorinated Interphases In Li-based Batteriesmentioning
confidence: 99%
“…Interested readers can refer to its principles in prior publications. , NR has the advantage of negligible damage to the samples and good penetration depth, facilitating its implementation in operando experiments. Nowadays, neutron reflectometry has been intensively utilized for LIBs for investigating the time evolution of the scattering length density–depth relation (with subnanometer resolution at ideal conditions) and inferred composition depth profile, formation/growth of the SEI layer, and volume expansion of Si anodes. , The detectable thickness ranges from nanometers to hundreds of nanometers.…”
Section: Experimental Approachmentioning
confidence: 99%