1996
DOI: 10.1002/(sici)1099-159x(199611/12)4:6<415::aid-pip152>3.0.co;2-1
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Solar cells with mesh-structured emitter
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Cited by 17 publications
(8 citation statements)
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“…For example, there were nine papers on DESSIS simulations published at the 14th European PV Solar Energy Conference in Barcelona, Spain, in 1997. At the Institute of Solar Energy Systems (ISE) in Freiburg, Germany, DESSIS was applied in particular to emitters with a mesh-structure [54], thin cells on transparent substrates [55] and recently to rear-contacted cells [56,57] and combined with process simulation of gettering [58]. At the University of Constance, Germany, DESSIS was applied with a combination of sophisticated ray tracing mainly to mechanically-textured Si solar cells [59,60].…”
Section: Developments From a Historical Perspectivementioning
confidence: 99%
“…For example, there were nine papers on DESSIS simulations published at the 14th European PV Solar Energy Conference in Barcelona, Spain, in 1997. At the Institute of Solar Energy Systems (ISE) in Freiburg, Germany, DESSIS was applied in particular to emitters with a mesh-structure [54], thin cells on transparent substrates [55] and recently to rear-contacted cells [56,57] and combined with process simulation of gettering [58]. At the University of Constance, Germany, DESSIS was applied with a combination of sophisticated ray tracing mainly to mechanically-textured Si solar cells [59,60].…”
Section: Developments From a Historical Perspectivementioning
confidence: 99%
“…A very common technique for measuring the excess carrier lifetime of a semiconductor sample is the microwave-detected photoconductance decay (µW-PCD) technique [1,2,8].…”
Section: A Microwave-detected Photoconductance Decaymentioning
confidence: 99%
“…On the other hand, temperature-dependent lifetime spectroscopy ͑TDLS͒ is based on the determination of the effective lifetime under low-level injection. We measured the TDLS curves by means of the microwave-detected photo-conductance decay technique ͑MW-PCD͒ [19][20][21] using an integrated liquid-nitrogen-cooled cryostat. To best approach lowlevel injection conditions in the whole temperature range of the TDLS curve, the lifetime measurements have been performed at the minimum bias light intensity required to exclude distortions of the monoexponential photoconductance decay due to trapping effects.…”
Section: Experimental Techniquesmentioning
confidence: 99%
