Sol–gel preparation and optical characterization of NiO and Ni1−xZnxO thin films

Investigation of structural, morphological and optical properties of nickel zinc oxide films prepared by sol–gel method

“…This decrease in the lattice parameters can be expected when Zn 2+ ions are replaced by Ni 2+ ions because of the smaller radius of Ni 2+ ions than Zn 2+ ions. Similar results were reported by Park and Kim [21] and Thota et al [23]. The surface morphology of NiZnO films has been studied by FESEM.…”

“…Furthermore NiO films are suitable for magnetoresistance sensors, chemical sensors [6,7], electrochromic devices [8] and transparent p-type semiconducting layer, smart windows [9] and dye sensitized photocathodes [10][11][12]. Some methods can be used for the preparation of NiZnO films such as sputtering [13], evaporation [14], electrodeposition [15], thermal decomposition [16], pulse laser deposition (PLD) [17][18][19], spray pyrolysis [20], and sol-gel techniques [21]. Among these methods, the sol-gel method is an attractive one due to its simplicity, safety, non-vacuum system of deposition, and inexpensive.…”

Determination of certain sol-gel growth parameters of nickel oxide films

“…In recent years, nickel oxide (NiO) which is a member of transition metal oxides has been greatly used in many apparatus [1] such as magnetic materials, catalysts, smart windows, solar cells [2][3][4][5] as well as electrochromic devices [6] because of its thermal and chemical insistence, low cost, superior electrical, optical and antiferromagnetic properties [7][8][9]. NiO, one of a few p-type metal oxide semiconductors, has a large band gap varied between 3.6 to 4.0 eV [10].…”

“…[18]. In the literature, NiO thin films have been grown as functions of spin layer number [7,14,19], sol-solution pH [20], annealing temperature [4,9,14,21], solvent type [22] and annealing ambient [14] in order to understand the effect of solgel spin coating growth parameters on the features of NiO films. However, according to our best knowledge, there has been no report on the fabrication of NiO film depending on sol-gel precursor solution molarity and there is only one study on effect of solution solvent type.…”

Spectroscopic ellipsometry characterization of electrochromic tungsten oxide and nickel oxide thin films made by sputter deposition

“…A third reason is that the optical properties of the pure oxides serve as starting points for understanding the EC performance of mixed W-Ni oxides which, as shown recently [15], can exhibit superior optical properties. Spectroscopic ellipsometry (SE) is the technique par preférénce to investigate the optical properties [16], and, not surprisingly, it has been used in the past for detailed studies on EC films of W oxide made by evaporation [17][18][19][20][21], sputter deposition [22][23][24][25][26][27][28][29], and sol-gel technology [30], as well as EC films of Ni oxide made by pulsed laser deposition [31], sputtering [23,25,32,33], atomic layer deposition [34], and sol-gel technology [35].…”