Abstract:Gd-, Y-, and La-doped CeO 2 films (Gd 0.2-Ce 0.8 O 2 , Y 0.2 Ce 0.8 O 2 , and La 0.2 Ce 0.8 O 2 ) are prepared on Ni-W tapes and La 2 Zr 2 O 7 -buffered Ni-W tapes using solgel method. The films are characterized by X-ray diffraction and atomic force microscopy. Results indicate that Y 0.2 Ce 0.8 O 2 (YCO) film shows the better crystallinity and the surface quality compared with Gd 0.2 Ce 0.8 O 2 (GCO) and La 0.2 Ce 0.8 O 2 (LCO) films. The YCO buffer layer has good in-plane texture with purely c-oriented grai… Show more
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