2014
DOI: 10.1016/j.amc.2014.05.107
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Software reliability growth modeling with dynamic faults and release time optimization using GA and MAUT

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Cited by 16 publications
(10 citation statements)
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References 39 publications
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“…We also note that previous papers have examined the problem of optimal release time . For instance, Rafi et al studied an SRGM and analyzed the optimal release policy by incorporating a generalized modified Weibull testing effort function.…”
Section: Introductionmentioning
confidence: 91%
“…We also note that previous papers have examined the problem of optimal release time . For instance, Rafi et al studied an SRGM and analyzed the optimal release policy by incorporating a generalized modified Weibull testing effort function.…”
Section: Introductionmentioning
confidence: 91%
“…The proposed model is motivated by the work of Kapur et al [11] and Pachauri et al [12]. In this section, a Software Reliability Growth Model based on Non Homogenous Poisson Process (NHPP) is developed by incorporating two things, one is the testing effort and second one is dynamic fault.…”
Section: Model Demonstrationmentioning
confidence: 99%
“…Pachauri et al [12] proposed Software reliability growth model with dynamic faults and optimal release time. Quadri et al [13] used generalized exponential curve as testing-effort function in Software Reliability Growth Model.…”
Section: Introductionmentioning
confidence: 99%
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