Small molecule detection by reflective interferometric Fourier transform spectroscopy (RIFTS)

Abstract

A new method for the compensation of matrix effects in biosensing experiments referred to as reflective interferometric Fourier transform spectroscopy (RIFTS) has been developed recently [1]. It employs a porous silicon sensor comprised of two porous silicon layers stacked one on top of the other. The structure has a complicated reflectivity spectrum that can be resolved by FFT analysis leading to three distinctive peaks which are assigned to the layers in the porous silicon structur. If the double layer is appropriately designed, the bottom layer can act as a reference channel. In this paper the specific sensing of small molecules using RIFTS is demonstrated for the first time. Ac-L-Lys-D-Ala-D-Ala has been immobilized to the sensor surface representing the capture probe and vancomycin was used as target analyte

Спектральные Оптические Свойства Керамических Нанопористых Мембран На Основе Анодного Оксида Алюминия И Покрытия Из Серебра В Парах Аммиака

“…Метод отражательной интерферометрической спектроскопии основан на отражении белого света от двух границ пористых структур, что приводит к усилению отраженного светового сигнала на длинах волн, соответствующих оптическим модам резонатора Фабри−Перо (FP), образованного системой тонкая пленка -окружающая среда (эффект Фабри−Перо) [4]. Адсорбция молекулярных частиц на поверхности поры вызывает изменение показателя преломления в структуре и сдвиг длины волны интерферометрических полос, которые можно обнаружить и количественно оценить [5]. Существенные преимуще-ства нанопористой платформы АОА по сравнению с плоскими полимерными пленками, ранее применяемыми для метода RIfS, заключаются в обеспечении уникальной трехмерной морфологии структур пор, позволяющей проводить её модификацию различными материалами и создавать селективные высокочувствительные активные поверхности для биомолекулярных и газовых сенсорных применений [6].…”

Development and Bioanalytical Applications of a White Light Reflectance Spectroscopy Label-Free Sensing Platform

“…Over the years, the method has evolved from the implementation of white light source and recording of the whole reflection spectrum [ 8 , 9 ], to monitoring of few wavelengths for multiplex detection in microtiter plates or sensor arrays [ 10 , 11 ], and to single wavelength set-ups suitable for imaging [ 12 ]. In addition, other substrates have been exploited as sensor elements in reflectometric interference spectroscopy systems, including porous silicon [ 13 , 14 , 15 , 16 , 17 ], porous silicon with thermally grown oxide [ 18 ], porous silicon-C composites [ 19 ], or other porous materials, such as TiO 2 [ 20 ]. Although the sensing systems based on reflectrometric interference are advantageous as compared to systems based on refractometry in terms of simplicity, robustness, and instrumentation cost, the cases of commercially available systems based on reflectrometric interference transduction principles that been successfully launched, is rather limited [ 21 , 22 ].…”

Porous silicon functionalization for possible arsenic adsorption

“…PS interferometric-based detection consists, in general, of the pore wall-analyte immobilization which generates a change in the refractive index of the layer and is detected as a corresponding shift in the interference patterns (therefore the optical thickness (OT)) [ 18 ]. This method is referred as reflective interferometric Fourier transform spectroscopy (RIFTS) [ 19 ].…”