Slurry Nebulization in Plasmas

Ebdon, Les; Foulkes, Mike E.; Sutton, Karen L.

doi:10.1039/a604914a

Cited by 134 publications

(119 citation statements)

References 56 publications

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“…The particle size was decreased quickly. After grinding 2 min, 90% particle sizes of the SiC-II-SiC-IV powders were minimized to less than 5 m. The average diameter was decreased to about 1.5 m. The rigorous studies reported that slurry particles larger than 5 m (in some reports 2 m) do not reach the plasma and result in a loss of signal [16]. Therefore, vibration mill method was used for all grind operations.…”

Section: Grinding Methods and Particle Size Distributionmentioning

confidence: 99%

“…But after the SiC powders were milled, the particle size distribution of SiC-II and SiC-III were approximately identical to that of SiC-IV. Thus, the deviation during transportation and incomplete evaporation could be corrected using the Certificate Reference Material SiC slurry which have been used as an alternative to aqueous standards in some analyses of solid sample [16]. Slurries of 0.1%, 0.25% and 1% (m V −1 ) were prepared from SiC-IV sample and spectral line intensities were recorded under the optimum plasma operating conditions as listed in Table 1.…”

Section: Calibrationmentioning

confidence: 99%

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Direct determination of impurities in high purity silicon carbide by inductively coupled plasma optical emission spectrometry using slurry nebulization technique

Zheng

Qiu

Zhang

et al. 2006

Analytica Chimica Acta

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A novel method for the determination of Al, Ca, Cr, Cu, Fe, Mg, Mn, Ni and Ti in high purity silicon carbide (SiC) using slurry introduction axial viewed inductively coupled plasma optical emission spectrometry (ICP-OES) was described. The various sizes of SiC slurry were dispersed by adding dispersant polyethylene imine (PEI). The stability of slurry was characterized by zeta potential measurement, SEM observation and signal stability testing. The optimal concentration of PEI was found to be 0.5 wt% for the SiC slurry. Analytical results of sub-m size SiC by the slurry introduction were in good accordance with those by the alkaline fusion method which verified that determination could be calibrated by aqueous standards. For m size SiC, results of most elements have a negative deviation and should be calibrated by the Certified Reference Material slurry. Owing to a rather low contamination in the sample preparation and stability of the slurry, the limits of detection (LODs), which are in the range of 40-2000 ng g −1 , superior to those of the conventional nebulization technique by ICP-OES or ICP-MS.

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Section: Grinding Methods and Particle Size Distributionmentioning

confidence: 99%

Section: Calibrationmentioning

confidence: 99%

Direct determination of impurities in high purity silicon carbide by inductively coupled plasma optical emission spectrometry using slurry nebulization technique

Zheng

Qiu

Zhang

et al. 2006

Analytica Chimica Acta

View full text Add to dashboard Cite

show abstract

“…Krejcowa et al estimated that at above 1.5% sample inhomogeneity becomes detrimental to precision and accuracy [16]. The slurry particles must be < 20 μm to guarantee efficient nebulization and atomization-excitation in the plasma [17]. Larger particles do not reach the plasma and cause signal loss.…”

Section: Introductionmentioning

confidence: 99%

ICP slurry introduction for simple and rapid determination of Pb, Mg and Ca in plant roots

2007

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Pb, Mg and Ca were simultaneously determined in plant roots by slurry introduction into inductively coupled plasma optical emission spectrometry (SS-ICP-OES). Slurries were prepared in 0.5% or 5% (v/v) HNO 3 with 0.5, or 5% (v/v) Triton X-100. Omission of the Triton X-100 improved results. Compared with wet ashing of the root sample followed by ICP-OES, ICP-MS and FAAS, the method offers: comparable results, simplification of sample preparation, less sample contamination, and reduction in the use of dangerous and corrosive reagents. The precisions varied: 1.7% for Mg, 2.8% for Ca and 4.3% for Pb, and were not significantly different (95% confidence level) from those of conventional analysis.

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“…Nebulization of a solution is normally used for sample introduction but slurries can be introduced as well with modification of the nebulizer and nebulization chamber. 7,8 In addition to the well-known multi-element capacity, recent equipment with a quartz torch in axial position makes it possible to obtain better sensitivity. Axial viewing of the ICP has the potential of about 10-fold improvement of LODs.…”

Section: Introductionmentioning

confidence: 99%

Determination of metal impurities in titanium dioxide using slurry sample introduction by axial viewing inductively coupled plasma optical emission spectrometry

Wang

Zhang

Qiu

et al. 2004

J. Anal. At. Spectrom.

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A slurry sample introduction technique for the analysis of TiO 2 powders by axial viewing ICP-OES is reported. Relationships between stable slurries and the conditions, such as particle size, pH, dispersant and its amount, were experimentally investigated. Slurries were prepared by mixing the TiO 2 powder with the dispersant poly(acrylate amine) (NH 4 PAA) and agitation in an ultrasonic bath to ensure good dispersion. The pH of the medium and amount of dispersant has been optimized. Impurities in TiO 2 were determined by an axial viewing ICP-OES spectrometer. As representatives, a Standard Reference Material 154 b of mm particle size TiO 2 and a nm particle size TiO 2 were selected and determined for micro and trace impurities. Analytical results obtained via slurry sample introduction were compared with those via nebulization of aqueous solutions prepared by acid digestion and fusion digestion. The determined results by slurry introduction were in good accordance with the stated values, which verified that the calibration curves could be established by aqueous standards.

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Slurry Nebulization in Plasmas

Cited by 134 publications

References 56 publications

Direct determination of impurities in high purity silicon carbide by inductively coupled plasma optical emission spectrometry using slurry nebulization technique

Direct determination of impurities in high purity silicon carbide by inductively coupled plasma optical emission spectrometry using slurry nebulization technique

ICP slurry introduction for simple and rapid determination of Pb, Mg and Ca in plant roots

Determination of metal impurities in titanium dioxide using slurry sample introduction by axial viewing inductively coupled plasma optical emission spectrometry

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