2015
DOI: 10.1134/s1063783415020213
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Size oscillations of the work function of a metal film on a dielectric substrate

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Cited by 13 publications
(13 citation statements)
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“…Figure 6 b depicts the schematic energy band diagram for the Al-capped SnO channel. Al has a Φ of 4.1 eV [ 39 , 40 ], which is lower than that of the SnO ( Φ = 4.6 eV). Therefore, the energy band near the back-channel surface displays downward bending, thereby forming the depletion region near the SnO-Al interface.…”
Section: Resultsmentioning
confidence: 99%
“…Figure 6 b depicts the schematic energy band diagram for the Al-capped SnO channel. Al has a Φ of 4.1 eV [ 39 , 40 ], which is lower than that of the SnO ( Φ = 4.6 eV). Therefore, the energy band near the back-channel surface displays downward bending, thereby forming the depletion region near the SnO-Al interface.…”
Section: Resultsmentioning
confidence: 99%
“…If one notices that a single edge is present in the limit of π/L z → 0, the result suggests that the jellium edge is 3π/(8K F ) and is shifted inside from the potential edge to satisfy the charge neutrality condition; [4,[6][7][8][9][10][11] Equation (20) indicates…”
Section: Theorymentioning
confidence: 99%
“…And it was shown that taking into account of geometric properties of a metal qualitatively changes the behaviour of the plasmon spectrum for atomically thin films. In addition, the description of quantum-sized effects on nanoscales and their influence on characteristics of metal films [4,5,6] pushed us to an assumption that these effects also should be taken into consideration. Because in the abovementioned works shown that with the change of a metal thickness wave vector and configuration of bound states change too.…”
Section: Introductionmentioning
confidence: 99%