Single event functional interrupt (SEFI) sensitivity in microcircuits

Investigation of Current Spike Phenomena during Heavy Ion Irradiation of NAND Flash Memories

“…Bus contention results when two or more portions of the control logic are on at the same time, when they are not both supposed to be on, and they end up fighting for control. This makes intuitive sense: if a heavy ion strike occurs in a control register, changes in operating modes can take place, i.e., SEFIs [10]. In this case, the DUT is receiving continuous commands to Read, and initially the current is at about 5 mA, which is the nominal Read current for this part.…”

Total Ionizing Dose (TID) Tests on Non-Volatile Memories: Flash and MRAM

“…These upsets will mostly interrupt the intended operation and lock it into an undefined function mode. New generations of shrinking cell area in flash memory complicated the distinction between single event upsets and single-event-functionalinterrupt (SEFI) [2], [3]. One recent study had shown the internal charge pump circuitry damaged by exposing to heavy ions [4].…”

Radiation Tests on 2Gb NAND Flash Memories

“…New generations of shrinking cell area in flash memory complicated the distinction between single event upsets and single-event-functionalinterrupt (SEFI). [3][4].…”