Single-electron tunneling force spectroscopy of an individual electronic state in a nonconducting surface

Abstract

A tunneling spectroscopy technique to measure the energy level of an electronic state in a completely nonconducting surface is demonstrated. Spectroscopy is performed by electrostatic force detection of single-electron tunneling between a scanning probe and the state as a function of an applied voltage. An electronic state near the surface of a SiO2 film is found 5.5±0.2eV below the conduction band edge. A random telegraph signal, caused by sporadic back-and-forth single-electron tunneling, is observed as the probe Fermi level passes through the state energy.

Atomic-resolution single-spin magnetic resonance detection concept based on tunneling force microscopy

“…Its capabilities for single electron tunneling spectroscopy, imaging and quantum state depth measurement on the atomic length scale have been well demonstrated [21][22][23][24][25][26][27]. Since this method relies on electrostatic force detection of individual tunneling events, it can operate on surfaces that are completely nonconductive.…”

Local density of trap states in SiO2 and Si3N4 films studied by single electron tunneling force spectroscopy

“…[15][16][17] was developed to characterize electrically isolated trap states with atomic scale spatial resolution. SETFS allows the energy of single defect states within the bandgap to be probed on non-conductive films with sub nanometer spatial resolution by varying the applied voltage between the tip and sample substrate.…”

Detection of discrete surface charge dynamics in GaAs-based nanowire through metal-tip-induced current fluctuation

“…Because fluctuation becomes obvious as the size of the device decreases [1][2][3] , the characterization and understanding of the charge dynamics of a surface trap has became an important issue in recent years. Although there are various scanning probe techniques that characterize the surface at an atomic scale, such as scanning tunneling spectroscopy (STS) [4][5][6] and electrostatic force microscopy (EFM) [7][8][9][10][11] , they mostly characterize static properties of the surface. The detection of the dynamics of the electric properties is difficult for such systems because the small conductance of the tiny tip contact results in a delay of the electric response.…”