Superlattices and Microstructures volume 44, issue 2, P191-196 2008 DOI: 10.1016/j.spmi.2008.06.001 View full text
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Richard Nader, Elie Moussaed, Michel Kazan, Joerg Pezoldt, Pierre Masri

Abstract: a b s t r a c tStructural and optical measurements were performed on silicon carbide (SiC) samples containing several polytypes. The SiC samples investigated were grown on (111) Si substrates by solid source molecular beam epitaxy (SSMBE). Several quantities of Ge were predeposited before the growth procedure. The influence of Ge on the SiC polytypes formation was studied by X-Ray, FTIR and µ-Raman characterizations methods. The spectra of the samples with less than one Ge monolayer exhibit a mixture of 2H, 1…

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