1997
DOI: 10.1016/s0169-4332(96)00729-5
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Secondary electron emission studies

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Cited by 168 publications
(89 citation statements)
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“…Experimental studies so far have reported a change in the work function with opposite sign in double-layer LSMO [34] and in manganite grain boundaries [35]. We note that other "extrinsic" factors, such as absorption of surface contaminants upon exposure to air or during low-temperature vacuum measurements that are extended in time, could also contribute to changes of the work function from its value on a pristine surface [36].…”
Section: Iv4 Discussionmentioning
confidence: 86%
“…Experimental studies so far have reported a change in the work function with opposite sign in double-layer LSMO [34] and in manganite grain boundaries [35]. We note that other "extrinsic" factors, such as absorption of surface contaminants upon exposure to air or during low-temperature vacuum measurements that are extended in time, could also contribute to changes of the work function from its value on a pristine surface [36].…”
Section: Iv4 Discussionmentioning
confidence: 86%
“…It is well known that the oxides of metals produce high SEY due to the increase of the escape depth of the generated electron because of reduction in number electronelectron interactions [36,37]. However, even in this condition with the surface in an oxide state the SEY stays below 1 due the multiple trapping sites of the grooves and the possible reduced density of the submicron structure and nano-spheres which can have sizes very similar to the escape depth (50 nm) and the shadowing effect of adjacent submicron and nanostructures.…”
Section: Discussionmentioning
confidence: 99%
“…Electron illumination generates secondary and Auger electrons inside the thin samples during the TEM observations. When this is combined with poor electrical conductivity, positive charges can build up due to the escape of the secondary and Auger electrons from the sample (18,19,(22)(23)(24)(25). For Cu 2 S, the difference in the band gaps of the semiconducting L-s phase and the insulating H-i phase, meaning that their Fermi levels are at different energies, gives rise to drastic changes in the charge distribution throughout the nanoplate volumes during the electronbeam-radiation process.…”
Section: Significancementioning
confidence: 99%
“…On the other hand, in an electronic insulator, the escape depth for secondary and Auger electrons is widely accepted to be on the order of tens of nanometers (19,24,25), at least an order of magnitude larger than in a semiconducting phase. Assuming an exponential decay of the charge distribution along the incident-electronbeam direction (Fig.…”
Section: Significancementioning
confidence: 99%