“…The spectrometer used is equipped with eight secondary targets (Al, CaF 2 , Fe, Ge, Zr, Mo, Al 2 O 3 , KBr, and LaB 6 ) that can polarize the X-ray tube-generated incident radiation through Barkla scattering. The methodology that was used for the elemental composition analysis is described in detail elsewhere [8]. The 20 elements determined by the ED-XRF method were Na, Mg, Al, Si, S, Cl, K, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Br, Sr, and Pb.…”