Scanning microwave microscopy technique for nanoscale characterization of magnetic materials

Developments of Interfacial Measurement Using Cavity Scanning Microwave Microscopy

“…However, there is still room for research in terms of microwave signal resolution and image optimization methods, and this is likely to prove a target for future exploration. At the same time, methods for transmitting microwaves more conducive to the tip radiation method are also being explored, such as the use of special AFM probes made of platinum [60] and micro-and nanoprocessing on silicon nitride cantilevers [61][62][63]. To improve the accuracy and sensitivity of microwave signal detection, we still need to both reduce the size of the probe under limited process conditions and reduce the influence of the noise signal on the test signal.…”

White Paper: Nanoscale impedance and permittivity properties at microwave frequencies using SMM

“…7,8 Figure 2 shows microwave frequency characterization of magnetic materials for analyzing and imaging local magnetic properties at the nanoscale. 9 The changes of the magnetic properties of yttrium iron garnet fi lms and permalloy samples have been studied as a function of external DC magnetic bias (Figure 2a, b). Bulk permalloy samples were imaged with different external fi eld strengths, including 225 and 330 Oe (Oersteds), showing that the magnetic properties of the two regions change with the external fi eld.…”

“…The magnetic bias does not alter the capacitive part, which is related to the dielectric constant of the material and not to the magnetic permeability. 9 SMM can be used for various materials science applications, including nanoscale electrical, dielectric, and magnetic measurements. Advanced calibration workfl ows are available for complex impedance imaging and dielectric quantifi cation.…”

“…canning microwave microscopy (SMM) is a nanoscale characterization technique used to extract accurate materials properties, including electrical, magnetic, and dielectric properties, at microwave frequencies (1)(2)(3)(4)(5)(6)(7)(8)(9)(10)(11)(12)(13)(14)(15)(16)(17)(18)(19)(20). In comparison to scanning capacitance microscopy, the SMM works at higher broadband frequencies measuring absolute impedance values, including calibrated capacitance and conductance of the sample.…”

Ferromagnetic resonance force microscopy of individual domain wall

“…As a result, FMR properties of individual DWs remain inaccessible although it is very important to obtain information at the individual DW level. A variety of spatially resolved measurement techniques for the investigation of FMR have been developed, including microscopy based on Brillouin light scattering, 7 time-resolved magneto-optical Kerr microscopy (TR-MOKE), 8 X-ray magnetic circular dichroism, 9 scanning thermal microscopy (SThM), 10 near-field microwave microscopy (SMM), 11 and ferromagnetic force resonance microscopy (FMRFM). 12 Scanning probe magnetometry using nitrogen vacancy centers in diamond (NV-SPM) 13 has recently been added to these techniques.…”