volume 23, issue 3, P54-60 1971
DOI: 10.1007/bf03355691
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Abstract: A B C D Fig. 1-Capacitator foils (A and B-good-246"fd/sq.in., C and D-poor--170"fd/sq.in.) 2X. 54-JOURNAL OF METALS, MARCH 1971The recent availability of the scanning electron microscope (SEM) has presented a unique instrument for the investigation of surface detail and structures that was previously impossible. SEM photographs of good and poor aluminum foil used in the capacitor industry revealed through linear analysis that increased capacitance is associated with more etch sites. Surface characterizations …

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