Sapphire surface polariton splitting due to resonance with magnesium oxide film phonon

Effects of Metallic, Semiconducting, and Insulating Substrates on the Coupling Involving Radiative Polaritons in Thin Oxide Films

“…Authors have studied films on metal substrates, [8][9][10][11][12][13] semiconducting substrates, [14][15][16][17][18][19] and insulating substrates. [20][21][22] A comparison of the effects of the conductivity of different metal substrates can also be found. 9,10 In addition, there is experimental and simulated data available for oxide layers less than 1 lm thick, where the IR optical properties are sensitive to the chemistry and conductivity of the substrate.…”

“…9,10 In addition, there is experimental and simulated data available for oxide layers less than 1 μm thick, where the IR optical properties are sensitive to the chemistry and conductivity of the substrate. 19,22 However, there has been no comprehensive study that examines how variations in substrate chemistry and conductivity impact IR radiation absorption in thin oxide films. Oxide films less than 1 μm thick are of technological relevance (e.g., in microelectronics) 23 and can be formed with high quality by utilizing, e.g., atomic layer deposition (ALD).…”

IR surface polariton spectroscopy as a method for studying the optical properties of ultra thin films

“…As a result, the calculated dispersion curves fit to the experimental, varying the dielectric constant of the film permeability, it can be determined not only all these constants, but also to receive information about modifying the optical constants of the substrate material on the nanometer thickness [5][6][7][8][9].…”

“…The resulting gap in this dispersion curves of SP substrate is proportional to the square root of the thickness of the film that allows you to measure the thickness of very thin films [1,[5][6][7][8][9]. The report discusses the experimental results on the optical properties of the films of MgO (thickness 10, 30, 100 and 300 nm) [5,7,9] and films of AlN (thickness of 40 nm and 400 nm) on sapphire [6][7][8][9]. SP spectra were measured in attenuated total internal reflection mode (ATR) on the FT-IR spectrometer IFS66v (Bruker), and range of external (in the far field) reflection at angles close to normal incidence.…”

“…The dispersion of surface polaritons of "MgO film 10 nm thick on sapphire." The solid curves are calculated using the optical constants of bulk MgO [5], and sapphire.…”