2013
DOI: 10.1021/nn403097p
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Role of Tip Chemical Reactivity on Atom Manipulation Process in Dynamic Force Microscopy

Abstract: The effect of tip chemical reactivity on the lateral manipulation of intrinsic Si adatoms toward a vacancy site on a Si(111)-(7 × 7) surface has been investigated by noncontact atomic force microscopy at room temperature. Here we measure the atom-hopping probabilities associated with different manipulation processes as a function of the tip-surface distance by means of constant height scans with chemically different types of tips. The interactions between different tips and Si atoms are evaluated by force spec… Show more

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Cited by 34 publications
(27 citation statements)
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References 31 publications
(58 reference statements)
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“…approximately 2 nN). 3,4,22 We assign this very small force as being the result of a passivated tip, similar to those described previously. 3,29,30 This very small attractive force helps explain the contrast inversion observed in constant ∆ f feedback by taking into account the total ∆ f values measured.…”
Section: Resultssupporting
confidence: 79%
“…approximately 2 nN). 3,4,22 We assign this very small force as being the result of a passivated tip, similar to those described previously. 3,29,30 This very small attractive force helps explain the contrast inversion observed in constant ∆ f feedback by taking into account the total ∆ f values measured.…”
Section: Resultssupporting
confidence: 79%
“…Recently, we also found the correlation between the capability of this manipulation and magnitude of the interaction force measured by AFM [24]. All tips used in this study produce clear atomic resolution.…”
Section: Atom Manipulationsupporting
confidence: 62%
“…A most interesting question is how the chemical reactivity of the tip apex affects a tip-induced reaction. For instance, a critical role of tip reactivity has been predicted by DFT calculations for AFMinduced Si atom hopping on Si(111) 35 . To examine the effects of tip reactivity, we functionalized the tip apex by adsorbing a single Xe atom using vertical manipulation 36 (Fig.…”
mentioning
confidence: 99%