2020
DOI: 10.1109/jphotov.2019.2961781
|View full text |Cite
|
Sign up to set email alerts
|

Review: Ultraviolet Fluorescence as Assessment Tool for Photovoltaic Modules

Abstract: Since 2010, the ultraviolet fluorescence (UVF) method is used to identify defects in wafer-based crystalline silicon photovoltaic (PV) modules. We summarize all known applications of fluorescence imaging methods on PV modules to identify defects and characteristics. The aim of this review is to present the basic principles for the interpretation of UVF images. The method allows for detection of cell cracks in a chronological order of occurrence, visualizing hot parts in a PV module, and identifying deviating b… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

1
62
0

Year Published

2020
2020
2024
2024

Publication Types

Select...
8

Relationship

1
7

Authors

Journals

citations
Cited by 74 publications
(82 citation statements)
references
References 39 publications
(52 reference statements)
1
62
0
Order By: Relevance
“…This is because of photo-bleaching over the edges or the regions between cells due to the diffusion of oxygen into the module ( Fig 5 ). Similar effect has been reported in the literature previously [ 29 , 32 , 33 , 37 , 38 ].…”
Section: Resultssupporting
confidence: 92%
See 1 more Smart Citation
“…This is because of photo-bleaching over the edges or the regions between cells due to the diffusion of oxygen into the module ( Fig 5 ). Similar effect has been reported in the literature previously [ 29 , 32 , 33 , 37 , 38 ].…”
Section: Resultssupporting
confidence: 92%
“…Any difference in the intensity of the light emitted back can be used to analyze the defects. UV-F can also be used for detecting cracks in the cells and hot spots in the PV modules [ 29 – 33 ]. UV-F imaging of the present modules was performed in a dark room to remove any effect of visible light.…”
Section: Methodsmentioning
confidence: 99%
“…Namely, this analysis shows that differentiating between failure modes that show equivalent IV profiles and low power loss can be difficult. However, improving these classifications can serve as an important precursor to more serious failures, as in the case of cracked cell modules, which may allow oxygen and water vapor penetration, causing future reliability and power loss issues [31]. In certain cases, these misclassifications can be very dangerous.…”
Section: Resultsmentioning
confidence: 99%
“…The increasing fluorescence was caused by increasing concentration of fluorophores upon aging and originated from degradation products of the polymer and/or the additives within the polymer. A detailed review on this topic was recently published (see [32] and the references given therein).…”
Section: Measurements On Field-aged Pv Modulesmentioning
confidence: 99%