“…to name a few. Using specific tips and measuring conditions, a whole range of data can be measured~Magonov & Reneker, 1997;Giancarlo & Flynn, 1998;Horber & Miles, 2003;Samori, 2004;Santos & Castanho, 2004;Butt et al, 2005;Nicholls et al, 2005;Muller & Dufrene, 2008!. Analyzing the geometry of the near apex region of the AFM tip can provide useful information for various applications including investigation of modified probes~e.g., nanotube attachments!~Cheung et al, 2000; Wade et al, 2004;Martinez et al, 2005! or for in situ analysis of tip shape during experiments~Fujisawa & Kizuka, 2003!.…”