Semi-Insulating III–V Materials 1980
DOI: 10.1007/978-1-4684-9193-7_4
|View full text |Cite
|
Sign up to set email alerts
|

Review of Techniques for Epitaxial Growth of High-Resistivity GaAs — Growth Systems, Problems and Substrate Effects

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
1
0

Year Published

1982
1982
1986
1986

Publication Types

Select...
3

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(1 citation statement)
references
References 29 publications
0
1
0
Order By: Relevance
“…Eleven-stage ring oscillators were fabricated using a layered GaAs structure grown on a Cr-doped substrate by AsC13-Ga-H, vapor phase epitaxy [6]. A dual-layer buffer consisting of a Cr-doped region followed by an undoped region is deposited first and is then followed by deposition of a 0.5 pm-thick channel layer doped at 7 X 10" cmW3.…”
mentioning
confidence: 99%
“…Eleven-stage ring oscillators were fabricated using a layered GaAs structure grown on a Cr-doped substrate by AsC13-Ga-H, vapor phase epitaxy [6]. A dual-layer buffer consisting of a Cr-doped region followed by an undoped region is deposited first and is then followed by deposition of a 0.5 pm-thick channel layer doped at 7 X 10" cmW3.…”
mentioning
confidence: 99%